- 8 Channels
- Hi pot ACW 5KV/30mA
- Hi pot DCW 6KV/10mA
- Insulation 1KV/12000MΩ
- Arcing detection
- True RMS measurement circuit
- Hi pot ACW 5KV/30mA
- Hi pot DCW 6KV/10mA
- Insulation 1KV/12000MΩ
- Arcing detection
- Measuring Time (0.1 ~ 999s)
- Adjustable ramp time (0.1 ~ 10s)
- Lowest Inductance (≥0.1μH)
- High voltage calibration
- programmable impulse voltage
- 200MHz/9bit High Impulse Test Sampling Rate
- Total Area Comparison Differential Area Comparison
- Lowest Inductance (0.5uH)
- HARM analysis / HFLT analysis
- High voltage calibration
- programmable impulse voltage
- Built-in storage 200 sets testing waveform
- Lowest Inductance (0.5uH)
- HARM analysis / HFLT analysis
- High voltage calibration
- programmable impulse voltage
- Built-in storage 200 sets testing waveform
- High voltage calibration
- programmable impulse voltage
- Built-in storage 200 sets testing waveform
- Total area comparison
- Differential area comparison
- Lowest Inductance (100uH)
- High voltage calibration
- programmable impulse voltage
- Built-in storage 200 sets testing waveform
- Total area comparison
- Lowest Inductance (50uH)
- 8 Channels
- High voltage calibration
- programmable impulse voltage
- Built-in storage 200 sets testing waveform Total area com