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Product

Hi pot Tester 7631 (8 Channel)

  • 8 Channels
  • Hi pot ACW 5KV/30mA
  • Hi pot DCW 6KV/10mA
  • Insulation 1KV/12000MΩ
  • Arcing detection
  • True RMS measurement circuit

Hi pot Tester 7630 (2 Channel)

  • Hi pot ACW 5KV/30mA
  • Hi pot DCW 6KV/10mA
  • Insulation 1KV/12000MΩ
  • Arcing detection
  • Measuring Time (0.1 ~ 999s)
  • Adjustable ramp time (0.1 ~ 10s)

Impulse Winding Tester 7750 Series 7750-10S/5S/5H/5E/1S

  • Lowest Inductance (≥0.1μH)
  • High voltage calibration
  • programmable impulse voltage
  • 200MHz/9bit High Impulse Test Sampling Rate
  • Total Area Comparison Differential Area Comparison

Impulse Winding Tester 7703 (5000V)

  • Lowest Inductance (0.5uH)
  • HARM analysis / HFLT analysis
  • High voltage calibration
  • programmable impulse voltage
  • Built-in storage 200 sets testing waveform

Impulse Winding Tester 7713 (10000V)

  • Lowest Inductance (0.5uH)
  • HARM analysis / HFLT analysis
  • High voltage calibration
  • programmable impulse voltage
  • Built-in storage 200 sets testing waveform

Impulse Winding Tester 7700 (5000V)

  • High voltage calibration
  • programmable impulse voltage
  • Built-in storage 200 sets testing waveform
  • Total area comparison
  • Differential area comparison

Impulse Winding Tester 7710 (10000V)

  • Lowest Inductance (100uH)
  • High voltage calibration
  • programmable impulse voltage
  • Built-in storage 200 sets testing waveform
  • Total area comparison

Impulse Winding Tester 7720 (5000V/8 Channel)

  • Lowest Inductance (50uH)
  • 8 Channels
  • High voltage calibration
  • programmable impulse voltage
  • Built-in storage 200 sets testing waveform Total area com